Information processing apparatus, defect analysis program,...

Details Information processing apparatus, defect analysis program,... Information processing apparatus, defect analysis program,...

2005-05-31

2005-05-31

Le, Dieu-Minh (Department: 2114)

Error detection/correction and fault detection/recovery

Data processing system error or fault handling

Reliability and availability

C717S124000

Reexamination Certificate

active

06901535

ABSTRACT:
The present invention has an display section for displaying an operation state of a program to a user in a time series manner based on program execution history information, an input section for allowing the user to designate a portion of a defect in the displayed operation sate, and an operation analysis section for analyzing a cause of the defect from the portion of the defect pointed out from the user by the input section and from the operation state of the program, and for specifying a solution for solving the cause of the defect. The operation analysis section regenerates the operation state on which the specified solution is reflected, and the display section displays the cause of the defect, the solution and the regenerated operation state to the user.

REFERENCES:
patent: 4984239 (1991-01-01), Suzuki et al.
patent: 5461609 (1995-10-01), Pepper
patent: 5488648 (1996-01-01), Womble
patent: 5522036 (1996-05-01), Shapiro
patent: 5948112 (1999-09-01), Shimada et al.
patent: 5987252 (1999-11-01), Leino et al.
patent: 5-53865 (1993-03-01), None
patent: 9-146797 (1997-01-01), None
patent: 10-312321 (1998-11-01), None

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