Error detection/correction and fault detection/recovery – Data processing system error or fault handling – Reliability and availability
Reexamination Certificate
2000-12-22
2004-08-31
Beausoliel, Robert (Department: 2114)
Error detection/correction and fault detection/recovery
Data processing system error or fault handling
Reliability and availability
C714S036000, C714S733000
Reexamination Certificate
active
06785846
ABSTRACT:
FIELD OF THE INVENTION
The present invention, in certain respects, relates to manufacturing defects in a microprocessor-based system. In other respects, the present invention relates to a method of diagnosing and isolating microprocessor circuitry problems.
BACKGROUND
As electronic components are designed smaller and smaller, these components include multiple leads having tighter pitches, which in turn leads to more manufacturing defects in the components. In a microprocessor-based system, it is necessary to rely on the processor and its associated components to work properly. When such a system is able to boot, i.e., to load an operating system into the system's main memory or random access memory, a diagnostic program can be run to isolate any problems. However, the ability to run the diagnostic program is dependent upon the system being able to boot. If the system cannot boot, then a troubleshooter, e.g., a technician, must go through the painstaking task of determining the source of the boot failure.
REFERENCES:
patent: 4455654 (1984-06-01), Bhaskar et al.
patent: 4726024 (1988-02-01), Guziak et al.
patent: 5327531 (1994-07-01), Bealkowski et al.
patent: 5379342 (1995-01-01), Arnold et al.
patent: 5513188 (1996-04-01), Parker et al.
patent: 5602989 (1997-02-01), Aria
patent: 5835695 (1998-11-01), Noll
patent: 6035420 (2000-03-01), Liu et al.
patent: 6061811 (2000-05-01), Bondi et al.
patent: 6070255 (2000-05-01), Dell et al.
patent: 6363492 (2002-03-01), James et al.
patent: 2002/0083370 (2002-06-01), Li
Beausoliel Robert
Bonzo Bryce P.
Intel Corporation
Pillsbury & Winthrop LLP
LandOfFree
Inexpensive method for diagnosing manufacturing defects in... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Inexpensive method for diagnosing manufacturing defects in..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Inexpensive method for diagnosing manufacturing defects in... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3344440