Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-08-21
2007-08-21
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000, C716S030000, C700S097000, C700S103000, C700S105000, C700S120000, C700S121000
Reexamination Certificate
active
10683369
ABSTRACT:
A method and system for performing dummy metal insertion in design data for an integrated circuit is disclosed, wherein the design data includes dummy metal objects inserted by a dummy fill tool. After a portion of the design data is changed, a check is performed to determine whether any dummy metal objects intersect with any other objects in the design data. If so, the intersecting dummy metal objects are deleted from the design data, thereby avoiding having to rerun the dummy fill tool.
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Blinne Richard
Lakshmanan Viswanathan
Montecillo Lena
Shrowty Vikram
Kik Phallaka
LSI Corporation
Strategic Patent Group Inc.
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