Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2007-05-08
2007-05-08
Kik, Phallaka (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C703S002000
Reexamination Certificate
active
10710733
ABSTRACT:
A method and model for modeling a characteristic C that is distributed within a domain. A provided base equation expresses C as a function f of a variable V through use of N+1 parameters C0, C1, . . . , CNin the form C=f(C0, C1, . . . , CN, V), wherein N≧1, and wherein C0, C1, . . . , CNare subject to uncertainty. A probability density function (PDF) is provided for describing the probability of occurrence of C0in accordance with the uncertainty. Subsidiary equations expressing C1, . . . , CNin terms of C0are provided. A value of C may be sampled by: providing a value V″ of V; picking a random value C0Rof C0from the PDF; computing values C1R, . . . , CNRof C1, . . . , CN, respectively, by substituting C0Rinto the subsidiary equations; and calculating C by substituting C0R, C1R, . . . , CNRand V″ into the base equation.
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Johnson Jeffrey B.
Martin, Jr. Bartholomew
Kik Phallaka
Kotulak Richard
Schmeiser, Olson & Watts
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