In situ scanning tunneling microscope tip treatment device...

Radiant energy – Inspection of solids or liquids by charged particles

Reexamination Certificate

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C977S840000, C977S849000, C977S852000

Reexamination Certificate

active

11240261

ABSTRACT:
A tip treatment device for use in an ultrahigh vacuum in situ scanning tunneling microscope (STM). The device provides spin polarization functionality to new or existing variable temperature STM systems. The tip treatment device readily converts a conventional STM to a spin-polarized tip, and thereby converts a standard STM system into a spin-polarized STM system. The tip treatment device also has functions of tip cleaning and tip flashing a STM tip to high temperature (>2000° C.) in an extremely localized fashion. Tip coating functions can also be carried out, providing the tip sharp end with monolayers of coating materials including magnetic films. The device is also fully compatible with ultrahigh vacuum sample transfer setups.

REFERENCES:
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patent: 2006/0071662 (2006-04-01), Xiang et al.
patent: 2007/0029480 (2007-02-01), Ding et al.
patent: 05018706 (1993-01-01), None
Scholz, et al. “Low thermal power electron beam annealing of scanning tunneling microscope tips” Rev. Sci. Instrum. 68 (8) Aug. 1997.
Schlickum, et al. “Spin-polarized scanning tunneling microscope for imaging the in-plane magnetization” Appl. Phys. Lett. 83 (10) Sep. 2003.
A. Kubetzka, et al., “Spin-Polarized Scanning Tunneling Microscopy with Antiferromagnetic probe Tips,” Phys. Rev. Lett., 2002, pp. 057201, vol. 88.
O. Pietsch, et al., “Recent Advances in Spin-Polarized Scanning Tunneling Microscopy,” Appl. Phys. A., 2004, pp. 781-785, vol. 78.

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