Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-06-26
2007-06-26
Sarkar, Asok Kumar (Department: 2891)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257SE29278
Reexamination Certificate
active
11325864
ABSTRACT:
The use of a carbon implant, in addition to the conventional fluorine implant, may significantly reduce the transient enhanced diffusion in P-type source drain extension regions. As a result, resistivity may be reduced, and dopant density may be increased, increasing current drive in some embodiments.
REFERENCES:
patent: 6303450 (2001-10-01), Park et al.
patent: 6830980 (2004-12-01), Mansoori et al.
patent: 2003/0207542 (2003-11-01), Chidambaram et al.
patent: 2005/0151172 (2005-07-01), Takemura et al.
Taylor Mitchell C.
Vanderpool Aaron O.
Intel Corporation
Sarkar Asok Kumar
Trop Pruner & Hu P.C.
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