Implanting carbon to form P-type source drain extensions

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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C257SE29278

Reexamination Certificate

active

11325864

ABSTRACT:
The use of a carbon implant, in addition to the conventional fluorine implant, may significantly reduce the transient enhanced diffusion in P-type source drain extension regions. As a result, resistivity may be reduced, and dopant density may be increased, increasing current drive in some embodiments.

REFERENCES:
patent: 6303450 (2001-10-01), Park et al.
patent: 6830980 (2004-12-01), Mansoori et al.
patent: 2003/0207542 (2003-11-01), Chidambaram et al.
patent: 2005/0151172 (2005-07-01), Takemura et al.

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