Implantation quality improvement by xenon/hydrogen dilution gas

Radiant energy – Ion generation – Arc type

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S42300F, C250S424000

Reexamination Certificate

active

07973293

ABSTRACT:
A method comprises supplying a dopant gas in an arc chamber of an ion source. A dilutant is supplied to dilute the dopant gas. The dilutant comprises about 98.5 wt. % xenon and about 1.5 wt. % hydrogen. An ion beam is generated from the diluted dopant gas using the ion source.

REFERENCES:
patent: 7586109 (2009-09-01), Perel et al.
patent: 2008/0179545 (2008-07-01), Perel
Designing Tracks for Better CD Control—Sep. 1, 2003—Semiconductor International, pp. 1 of 9 at http://www.semiconductor.net/article/CA319214.html Dec. 14, 2008.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Implantation quality improvement by xenon/hydrogen dilution gas does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Implantation quality improvement by xenon/hydrogen dilution gas, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Implantation quality improvement by xenon/hydrogen dilution gas will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2725076

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.