Implantation-less approach to fabricating strained...

Semiconductor device manufacturing: process – Formation of semiconductive active region on any substrate – Amorphous semiconductor

Reexamination Certificate

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C483S064000, C483S902000, C257SE21090, C257SE21092, C257SE21461

Reexamination Certificate

active

07338886

ABSTRACT:
A method of fabricating a semiconductor substrate includes forming a buffer layer on the substrate. A Ge containing layer, such as a SiGe is formed over the buffer layer. The buffer layer includes defects at the interface of the substrate and buffer layer. The substrate is oxidized to transform the buffer layer to a buried oxide layer.

REFERENCES:
patent: 6649492 (2003-11-01), Chu et al.
patent: 6653209 (2003-11-01), Yamagata
patent: 6723541 (2004-04-01), Sugii et al.
patent: 2003/0207545 (2003-11-01), Yasukawa
patent: 2005/0003229 (2005-01-01), Bedell et al.

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