Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-04-10
2007-04-10
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
11424613
ABSTRACT:
A method for measuring impedance of a microprocessor chip, electronic packaging, and circuit board power supply system by generating a pseudo-impulse current having a width size in the time domain not larger than the inversion of a maximum frequency of interest and obtaining a voltage measurement in a frequency domain of the pseudo-impulse current. The mechanism of the present invention then predicts the normalized Fourier transformation of the current in the frequency domain, wherein the normalized Fourier transformation depends upon a switching charge of the pseudo-impulse current, measures the switching charge of the pseudo-impulse current, obtains a first current measurement at zero frequency using the measured switching charge, and obtains a second current measurement at a frequency of interest using the first current measurement. The mechanism of the present invention then calculates the impedance of the chip/package/board power supply system using the voltage measurement and the second current measurement.
REFERENCES:
patent: 6768952 (2004-07-01), Kantorovich et al.
patent: 6911827 (2005-06-01), Kantorovich et al.
Aikawa Makoto
Dhong Sang Hoo
Flachs Brian
Harvey Paul Marlan
Michael Brad William
Barlow John
Gerhardt Diana R.
International Business Machines - Corporation
Kinslow Cathrine K.
Lau Tung S.
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