Impact checking technique

Details Impact checking technique Impact checking technique

2008-01-22

2008-01-22

Dinh, Paul (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000

Reexamination Certificate

active

11034420

ABSTRACT:
A method includes determining whether or not a statement in a design has any functionality. The functionality includes impact on the operation of the design. Also included in the invention is in impact checker to determine the impact of portions of the design on the operation of the design.

REFERENCES:
patent: 6131078 (2000-10-01), Plaisted
patent: 6148436 (2000-11-01), Wohl
patent: 6216252 (2001-04-01), Dangelo et al.
patent: 6405351 (2002-06-01), Steiss et al.
patent: 6611947 (2003-08-01), Higgins et al.
patent: 6665844 (2003-12-01), Stanion
patent: 2002/0138812 (2002-09-01), Johannsen
patent: 2003/0158720 (2003-08-01), Liu
patent: 2003/0225552 (2003-12-01), Ganai et al.
patent: 2003/0229863 (2003-12-01), Narain et al.
patent: 2005/0166167 (2005-07-01), Ivancic et al.

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