Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making electrical device
Reexamination Certificate
2007-10-10
2008-12-16
McPherson, John A. (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making electrical device
C430S320000, C430S330000
Reexamination Certificate
active
07465532
ABSTRACT:
A method for fabricating a thin film component according to one embodiment comprises forming a wafer having a thin film layer, a release layer, and a patterned layer of photoresist; transferring the pattern of the layer of photoresist to the release layer and the thin film layer; adding a layer of metal to the wafer; heating the wafer to a predetermined temperature for a period of time sufficient to cause deformation of the photoresist to an extent that the photoresist creates cracks in the metal layer; applying a solvent to dissolve at least a portion of the release layer, the solvent penetrating the cracks in the metal layer to reach the release layer; and removing the release layer and any portions of the layers above the release layer.
REFERENCES:
patent: 7297470 (2007-11-01), Cornwell et al.
patent: 2005/0147924 (2005-07-01), Cornwell et al.
patent: 2001-344711 (2001-12-01), None
Cornwell Dwight
Werner Douglas Johnson
Hitachi Global Storage Technologies - Netherlands B.V.
McPherson John A.
Zilka-Kotab, PC
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