Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-01-31
2008-10-28
Vu, David (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C438S141000
Reexamination Certificate
active
07442974
ABSTRACT:
An image sensor with a plurality of photodiodes that each have a first region constructed from a first type of material and a second region constructed from a second type of material. Located adjacent to the first region and between second regions of adjacent photodiodes is a barrier region. The photodiodes are reversed biased to create depletion regions within the first regions. The barrier region limits the lateral growth of the depletions regions and inhibits depletion merger between adjacent photodiodes.
REFERENCES:
patent: 6169318 (2001-01-01), McGrath
patent: 6795117 (2004-09-01), Tay
patent: 6878568 (2005-04-01), Rhodes et al.
patent: 6909162 (2005-06-01), Wu et al.
patent: 7091536 (2006-08-01), Rhodes et al.
Irell & Manella LLP
Vu David
Yorks Ben J.
LandOfFree
Image sensor with inter-pixel isolation does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Image sensor with inter-pixel isolation, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image sensor with inter-pixel isolation will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4009987