Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2006-01-09
2009-11-17
Purvis, Sue (Department: 2826)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S292000, C257S233000, C257S239000, C257S458000, C257SE27132, C257SE27133
Reexamination Certificate
active
07619266
ABSTRACT:
An image sensor device having a pixel cell with a pinned photodiode, which utilizes the fixed charge of an high K dielectric layer over the n-type region for the pinning effect without implanting a p-type layer over the n-type region, and methods of forming such a device.
REFERENCES:
patent: 6023081 (2000-02-01), Drowley et al.
patent: 6140630 (2000-10-01), Rhodes
patent: 6204524 (2001-03-01), Rhodes
patent: 6278102 (2001-08-01), Hook et al.
patent: 6310366 (2001-10-01), Rhodes et al.
patent: 6326652 (2001-12-01), Rhodes
patent: 6333205 (2001-12-01), Rhodes
patent: 6376868 (2002-04-01), Rhodes
patent: 6570222 (2003-05-01), Nozaki et al.
patent: 6847051 (2005-01-01), Hong
patent: 2002/0117690 (2002-08-01), Rhodes
patent: 2003/0228736 (2003-12-01), Kimura
patent: 2004/0229424 (2004-11-01), Fischer et al.
patent: 2005/0274994 (2005-12-01), Rhodes
patent: 2006/0054937 (2006-03-01), Lucovsky et al.
patent: 2006/0084195 (2006-04-01), Lyu
patent: 04 038872 (1992-02-01), None
patent: 04038872 (1992-02-01), None
International Preliminary Report on Patentability dated Jul. 15, 2008, issued in PCT Application No. PCT/US2007/000408.
Manchanda, L., et al., Si-Duped Aluminates for High Temperature Metal-Gate CMOS: Zr-Al-Si-O, A Novel Gate Dielectric for Low Power Applications, Bell Laboratores, Lucent Technologies, Murray Hill, N.J. 07974, (2000).
Park< Hong Bae, et al., Effects of Plasma Nitridation of Al2O3Interlayer on Thermal Stability, Fixed Charge Density, and Interfacial Trap States of HfO2Gate Dielectric Films Grown by Atomic Layer Deposition, Journal of Applied Physics, vol. 94, No. 3, Aug. 1, 2003.
Aptina Imaging Corporation
Cruz Leslie Pilar
Dickstein & Shapiro LLP
Purvis Sue
LandOfFree
Image sensor with improved surface depletion does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Image sensor with improved surface depletion, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image sensor with improved surface depletion will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4082016