Image sensor with improved surface depletion

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

Reexamination Certificate

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Details

C257S292000, C257S233000, C257S239000, C257S458000, C257SE27132, C257SE27133

Reexamination Certificate

active

07619266

ABSTRACT:
An image sensor device having a pixel cell with a pinned photodiode, which utilizes the fixed charge of an high K dielectric layer over the n-type region for the pinning effect without implanting a p-type layer over the n-type region, and methods of forming such a device.

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