Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-07-14
2008-08-05
Nguyen, Ha (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
Reexamination Certificate
active
07408365
ABSTRACT:
Disclosed are an optical test apparatus, related test method and method of operation, and related probe card adapted to optically test an image sensor. An illumination source of the optical test apparatus provides an optical test signal to the image sensor through the probe card. The optical test signal has a property variably defined by a feedback loop formed between a reference image sensor associated with the probe card and a control unit connected between the reference image sensor and the illumination source.
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Lee Jongmoon
Lee Jun-taek
Benitez Joshua
Nguyen Ha
Samsung Electronics Co,. Ltd.
Volentine & Whitt PLLC
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