Image sensor system for monitoring condition of electrode...

Chemistry: electrical and wave energy – Apparatus – Electrolytic

Reexamination Certificate

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C204S297010, C204S297060, C204S297070

Reexamination Certificate

active

07416648

ABSTRACT:
A system for use in manufacturing semiconductor devices, is provided. The system includes an electrochemical processing tool and an image sensor. The electrochemical processing tool includes an electrode located at a central region of a platen. The electrode is adapted for contacting a wafer workpiece during certain processing of the wafer workpiece using the tool. At least part of the electrode is viewable from above the platen when the electrochemical processing tool is operably assembled. The image sensor is capable of capturing an image of the viewable part of the electrode. The image sensor is positioned above the platen. The image sensor is adapted to be aimed at the electrode when an image of the electrode is to be taken with the image sensor.

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