Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Including contaminant removal or mitigation
Reexamination Certificate
2008-05-13
2008-05-13
Thai, Luan (Department: 2891)
Semiconductor device manufacturing: process
Packaging or treatment of packaged semiconductor
Including contaminant removal or mitigation
C438S118000
Reexamination Certificate
active
11342799
ABSTRACT:
An image sensor device and methods thereof. In an example method, a protective layer may be formed over at least one microlens. An adhesive layer may be formed over the protective layer. The adhesive layer may be removed so as to expose the protective layer. The protective layer may be removed so as to expose the at least one microlens, the exposed at least one microlens not including residue from the adhesive layer. The at least one microlens may have an improved functionality due at least in part to the lack of residue from the adhesive layer. In an example, the at least one microlens may be included in an image sensor module.
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Han Seong-Il
Heo Sun-Wook
Kang Suk-Chae
Kim Gu-Sung
Kim Jong-Woo
Harness, Dickey & Pierce, PLLC
Samsung Electronics Co,. Ltd.
Thai Luan
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