Semiconductor device manufacturing: process – Making device or circuit responsive to nonelectrical signal – Responsive to electromagnetic radiation
Reexamination Certificate
2011-04-05
2011-04-05
Smith, Zandra (Department: 2822)
Semiconductor device manufacturing: process
Making device or circuit responsive to nonelectrical signal
Responsive to electromagnetic radiation
C438S069000, C438S781000, C257S432000, C257S440000, C257SE31122
Reexamination Certificate
active
07919350
ABSTRACT:
An image sensor is formed by providing a semiconductor substrate having first, second and third pixel regions and first and second color filters disposed on their respective pixel regions. A photoresist layer is coated over the first and second color filters and the third color pixel region. The photoresist is removed from the first and second color filters, leaving a third color filter of substantially the same height as the first and second color filters. Micro lenses may then be formed on the color filters.
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Notice to File a Response/Amendment to the Examination Report and English-language translation issued Nov. 10, 2006 in counterpart Korean application No. 10-2005-0088242.
Cho Jung-hyun
Heo Sun-Wook
Lee Jae-Ku
Mills & Onello LLP
Novacek Christy L
Samsung Electronics Co,. Ltd.
Smith Zandra
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