Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation
Reexamination Certificate
2005-11-28
2009-10-13
Wilson, Allan R. (Department: 2815)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Electromagnetic or particle radiation
C257SE27067
Reexamination Certificate
active
07602034
ABSTRACT:
In an image sensor and a method for forming the same, the method comprises: preparing a substrate having a pixel array region and a peripheral circuit region; sequentially stacking a gate electrode layer and a mask layer on the substrate; patterning the gate electrode layer and the mask layer to form a gate pattern; implanting impurities in the substrate in the pixel array region to form a photoelectric conversion region; and removing the mask layer.
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patent: 6570222 (2003-05-01), Nozaki et al.
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patent: 10-2002-0045451 (2002-06-01), None
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Notice to File a Response/Amendment to the Examination Report and English-language translation issued Aug. 31, 2006 in counterpart Korean application No. 10-2004-0098668.
Mills & Onello LLP
Samsung Electronics Co,. Ltd.
Wilson Allan R.
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