Image analysis – Pattern recognition – Feature extraction
Reexamination Certificate
2007-05-01
2007-05-01
Miriam, Daniel (Department: 2624)
Image analysis
Pattern recognition
Feature extraction
Reexamination Certificate
active
10681373
ABSTRACT:
An image processing method and an image processing apparatus are disclosed, in which curved linear objects and uneven linear objects as well as rectilinear objects can be detected easily and accurately. Edge pixels P1extracted from a gray-scale image to be processed are sequentially considered to search for an edge pixel having an opposite direction of density gradient to each of the edge pixels P1within the range of a predetermined length W along the direction orthogonal to the edges. Once an edge pixel P2meeting these conditions is extracted, a line segment having a length L is set extending in the direction C parallel to the edge of the edge pixels P1from an intermediate point Q between the extracted edge pixel P2and the edge pixel P1under consideration.
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Fujieda Shiro
Matsumoto Toshihiko
Suzuki Yuji
Foley & Lardner LLP
Miriam Daniel
Omron Corporation
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