Image analysis measurement apparatus and methods

Details Image analysis measurement apparatus and methods Image analysis measurement apparatus and methods

1975-05-23

1978-09-19

Britton, Howard W.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

235 92PC, 364515, H04N 718

Patent

active

041158032

ABSTRACT:
An image analysis measurement system is capable of performing a variety of measurements on single features within a field of scan or independently on multiple features within the field. The system provides direct determination of measurements across multiple features in the field for specific parameters. The measurements include, for example, projected length in any direction, perimeter, Feret's diameter in any direction, longest dimension, convex perimeter, and breadth.

REFERENCES:
patent: 2791695 (1957-05-01), Bareford
patent: 3390229 (1968-06-01), Williams
patent: 3619494 (1971-11-01), Fisher
patent: 3624604 (1971-11-01), Gibbard
patent: 3751585 (1973-08-01), Fisher
patent: 3946361 (1976-03-01), Cruttwell

Affiliated with

Also associated with

Rating

Image analysis measurement apparatus and methods does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Image analysis measurement apparatus and methods, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Image analysis measurement apparatus and methods will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2122581