Image analysis for pick and place machines with in situ...

Details Image analysis for pick and place machines with in situ... Image analysis for pick and place machines with in situ...

2005-05-18

2010-10-12

Le, Brian Q (Department: 2624)

Image analysis

Pattern recognition

Template matching

C382S151000, C382S153000

Reexamination Certificate

active

07813559

ABSTRACT:
The present invention includes a method of determining a location of a component on a workpiece. A before-placement standard image is acquired of an intended placement location on a standard workpiece. Then, a standard component is placed upon the standard workpiece and the placement is verified. An after-placement standard image is acquired and a standard difference image is created from the before and after standard images. Then, a before-placement test image is acquired of an intended placement location on the workpiece. A component is then placed upon the workpiece, and after-placement test image is acquired. A test difference image is created from the before and after test images. A first offset is calculated between the before standard difference image and the before test image. Then, the test difference is transformed based on the first offset to generate a difference test image (DTR) that is registered to the standard difference image. The standard difference image is correlated to the registered difference test image (DTR) to generate a registration offset indicative of placement efficacy.

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