4. Image analysis
  5. Pattern recognition
  6. Template matching

Thomas W. Bushman

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Image analysis for pick and place machines with in situ...

Image analysis – Pattern recognition – Template matching
Reexamination Certificate

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Pick and place machine with component placement inspection

Optics: measuring and testing – Position or displacement
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Rotation and scale invariant image finder

Image analysis – Pattern recognition – Template matching
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Profile ID: LFUS-PAI-P-2067915

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