Illumination system for optical inspection

Optics: measuring and testing – Inspection of flaws or impurities – Surface condition

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S237100

Reexamination Certificate

active

07630069

ABSTRACT:
Apparatus for generating optical radiation includes a laser, which is configured to operate in multiple transverse modes simultaneously so as to generate an input beam, which is characterized by a first speckle contrast. The transverse modes of the input beam are optically mixed so as to generate an output beam have a second speckle contrast, which is substantially less than the first speckle contrast.

REFERENCES:
patent: 3628080 (1971-12-01), Lindequist
patent: 3967123 (1976-06-01), Deylius et al.
patent: 4619508 (1986-10-01), Shibuya et al.
patent: 4933961 (1990-06-01), Rushbrooke et al.
patent: 5161008 (1992-11-01), Funk
patent: 5264912 (1993-11-01), Neukermans et al.
patent: 5500770 (1996-03-01), Zinter et al.
patent: 5526458 (1996-06-01), Hochgraf
patent: 5633721 (1997-05-01), Mizutani
patent: 5650614 (1997-07-01), Yasutake et al.
patent: 5673144 (1997-09-01), Chastang et al.
patent: 5729374 (1998-03-01), Tiszauer et al.
patent: 5729383 (1998-03-01), Chastang et al.
patent: 5739542 (1998-04-01), Sudo et al.
patent: 5774224 (1998-06-01), Kerstens
patent: 5801824 (1998-09-01), Henley
patent: 5822055 (1998-10-01), Tsai et al.
patent: 5900941 (1999-05-01), Matsuyama et al.
patent: 5903342 (1999-05-01), Yatsugake et al.
patent: 5933473 (1999-08-01), Kitaguchi
patent: 6104481 (2000-08-01), Isozaki et al.
patent: 6122046 (2000-09-01), Almogy
patent: 6137570 (2000-10-01), Chuang et al.
patent: 6249381 (2001-06-01), Suganuma
patent: 6304373 (2001-10-01), Zavislan
patent: 6313465 (2001-11-01), Nittoh et al.
patent: 6323984 (2001-11-01), Trisnadi
patent: 6347173 (2002-02-01), Suganuma et al.
patent: 6369888 (2002-04-01), Karpol et al.
patent: 6445487 (2002-09-01), Roddy et al.
patent: 6522437 (2003-02-01), Presley et al.
patent: 6594076 (2003-07-01), Satou
patent: 6621570 (2003-09-01), Danko
patent: 6646272 (2003-11-01), Rushbrooke et al.
patent: 6693930 (2004-02-01), Chuang et al.
patent: 6778267 (2004-08-01), Drake
patent: 6853446 (2005-02-01), Almogy et al.
patent: 6895149 (2005-05-01), Jacob et al.
patent: 6956878 (2005-10-01), Trisnadi
patent: 7015452 (2006-03-01), Benz et al.
patent: 7116413 (2006-10-01), Vaez-Iravani
patent: 2001/0030296 (2001-10-01), Ishimaru et al.
patent: 2001/0052975 (2001-12-01), Biellak et al.
patent: 2002/0067478 (2002-06-01), Karpol et al.
patent: 2003/0011850 (2003-01-01), Sidorovich et al.
patent: 2004/0008399 (2004-01-01), Trisnadi
patent: 2005/0219518 (2005-10-01), Korngut et al.
patent: 4 434 699 (1996-04-01), None
patent: 0 589 179 (1994-03-01), None
patent: 2 126 716 (1984-03-01), None
patent: 63-255917 (1988-10-01), None
patent: 02-035447 (1990-02-01), None
patent: 09-305094 (1997-11-01), None
patent: 10-335240 (1998-12-01), None
patent: 2001-250760 (2001-09-01), None
patent: WO 00/03234 (2000-01-01), None
patent: WO 03/027644 (2003-04-01), None
European Patent Office, Communication pursuant to Article 94(3) EPC, issued for EP 03799277.3-1234 on Feb. 17, 2009.
Japanese Patent Office, Notice of Reasons for Rejection, issued for patent application P2004-541515 on Aug. 12, 2008, with English translation.
Japanese Patent Office, Notice of Reasons for Rejection, issued for patent application P2004-541515 on Feb. 17, 2009, with English translation.
Patent Cooperation Treaty, International Search Report for PCT/US03/28054, mailed Nov. 16, 2005, ISA: European Patent Office, Rijswijk, Netherlands.
Patent Cooperation Treaty, International Search Report for PCT/US03/28062, mailed Dec. 30, 2003, ISA: European Patent Office, Rijswijk, Netherlands.
Patent Cooperation Treaty, International Search Report for PCT/US03/28061, mailed Dec. 16, 2003, ISA: European Patent Office, Rijswijk, Netherlands.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Illumination system for optical inspection does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Illumination system for optical inspection, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Illumination system for optical inspection will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4149150

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.