Semiconductor device manufacturing: process – Chemical etching – Combined with the removal of material by nonchemical means
Reexamination Certificate
2011-06-14
2011-06-14
Olsen, Allan (Department: 1716)
Semiconductor device manufacturing: process
Chemical etching
Combined with the removal of material by nonchemical means
C257SE21222, C257SE21230
Reexamination Certificate
active
07960284
ABSTRACT:
Affords a III-V compound semiconductor substrate manufacturing method that enables enhancement of the substrate PL intensity. In such a III-V compound semiconductor substrate manufacturing method, first, the surface3aof a wafer3is polished (polishing step). Second, the surface3aof the wafer3is cleaned (first cleaning step S7). Next, the surface3aof the wafer3is subjected to first dry-etching, employing a halogen-containing gas, while first bias voltage is applied to a chuck24for carrying the wafer3. Subsequently, the surface3aof the wafer3is subjected to second dry-etching, employing the halogen-containing gas (second dry-etching step S11), while second bias power lower than the first bias power is applied to the chuck24.
REFERENCES:
patent: 6444593 (2002-09-01), Ngo et al.
patent: 6455398 (2002-09-01), Fonstad et al.
patent: 6488767 (2002-12-01), Xu et al.
patent: 7078344 (2006-07-01), Bailey et al.
patent: 7129167 (2006-10-01), Bailey et al.
patent: 7159599 (2007-01-01), Verhaverbeke et al.
patent: 7585686 (2009-09-01), Verhaverbeke et al.
patent: 7602046 (2009-10-01), Ghyselen et al.
patent: 7732301 (2010-06-01), Pinnington et al.
patent: 2003/0045098 (2003-03-01), Verhaverbeke et al.
patent: 2007/0018284 (2007-01-01), Nakayama et al.
patent: 2007/0093071 (2007-04-01), Verhaverbeke et al.
patent: 2007/0284696 (2007-12-01), Matsumoto
patent: 2008/0085477 (2008-04-01), Verhaverbeke et al.
patent: 2008/0138917 (2008-06-01), Verhaverbeke et al.
patent: 2008/0145797 (2008-06-01), Verbeke et al.
patent: 2008/0176400 (2008-07-01), Hachigo et al.
patent: 2008/0230780 (2008-09-01), Urashima
patent: 2008/0286697 (2008-11-01), Verhaverbeke et al.
patent: 2009/0029550 (2009-01-01), Matsumoto
patent: 2009/0278233 (2009-11-01), Pinnington et al.
patent: 1679740 (2006-07-01), None
patent: H02-207527 (1990-08-01), None
patent: H05-291231 (1993-11-01), None
patent: 2002-289579 (2002-10-01), None
patent: 2006-060069 (2006-03-01), None
patent: 2006-185964 (2006-07-01), None
patent: WO-2005-041283 (2005-05-01), None
V. S. Wang et al., “Triple-Crystal X-Ray Diffraction Analysis of Reactive Ion Etched Gallium Arsenide,” Journal of Applied Physics Apr. 15, 1994, pp. 3835-3841, vol. 75, No. 8, American Institute of Physics, NY.
Hachigo Akihiro
Matsumoto Naoki
Nishiura Takayuki
Judge James W.
Olsen Allan
Sumitomo Electric Industries Ltd.
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