Computer-aided design and analysis of circuits and semiconductor – Nanotechnology related integrated circuit design
Reexamination Certificate
2006-03-03
2009-02-10
Whitmore, Stacy A (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Nanotechnology related integrated circuit design
C716S030000
Reexamination Certificate
active
07490303
ABSTRACT:
A method comprises tracing a first and second terminal of a junction through a circuit layout to associated power supplies to determine their respective defined bias values. The method further comprises comparing the defined bias values of each terminal in order to determine, based on the comparison, whether the junction is forward biased.
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Kemerer Douglas W.
Seibert Edward W.
Wang Lijiang L.
Greenblum & Bernstein P.L.C.
International Business Machines - Corporation
Simmons Ryan K.
Whitmore Stacy A
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