Identifying high E-field structures

Details Identifying high E-field structures Identifying high E-field structures

2006-12-12

2006-12-12

Do, Thuan (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000

Reexamination Certificate

active

07149988

ABSTRACT:
Power plane structures that may generate high E-fields can be identified and flagged for additional review by representing a boundary of the structures as a function, and evaluating the second derivative of that function. The result can be compared against a threshold value to determine if further review of the structure is desirable.

REFERENCES:
patent: 6744434 (2004-06-01), Kindratenko et al.
patent: 2004/0120571 (2004-06-01), Duvdevani et al.
patent: 2004/0126005 (2004-07-01), Duvdevani et al.
patent: 2004/0165762 (2004-08-01), Messina et al.
patent: 2005/0132306 (2005-06-01), Smith et al.

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