IC with built-in electrical quality control flag

Details IC with built-in electrical quality control flag IC with built-in electrical quality control flag

1981-11-12

1984-01-24

Stellar, George G.

Static information storage and retrieval

Read/write circuit

Bad bit

365201, 3072381, 324113, 340653, G11C 2900, G01R 3128, H01L 2700

Patent

active

044280688

ABSTRACT:
An integrated semiconductor circuit device is provided with a special purpose readable indicator without providing additional pins. The indicator may be utilized to store information pertinent to the operativeness of the integrated circuit. The results of quality control monitoring may be written into the store to serve as a flag. A specific application is in semiconductor memory arrays having redundancy memory capability to automatically replace defective memory cells in the primary array. To enable one to know whether or not the redundancy memory array is being used, this information is written into a quality control storage cell. This cell may be a ROM system which may be accessed during a check mode.

REFERENCES:
patent: 4281398 (1981-07-01), McKenny et al.

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