Semiconductor device manufacturing: process – Chemical etching – Vapor phase etching
Patent
1998-08-07
2000-01-04
Powell, William
Semiconductor device manufacturing: process
Chemical etching
Vapor phase etching
438719, 252 791, 252 794, H01L 21306
Patent
active
060109661
ABSTRACT:
A process for anisotropically etching a metal-containing layer 15 on a substrate 10 is described. The etching process uses an energized process gas of a comprising halogen-containing etchant gas for etching the metal-containing layer to form volatile metal compounds, and hydrocarbon inhibitor gas having a carbon-to-hydrogen ratio of from about 1:1 to about 1:3, to deposit inhibitor on etched metal features and provide anisotropic etching. More preferably, the hydrocarbon inhibitor gas comprises a high carbon-to-hydrogen ratio of from about 1:1 to 1:2.
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Applied Materials Inc.
Powell William
Umez-Eronini Lynette T.
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