Hybrid semiconductor substrate including...

Semiconductor device manufacturing: process – Introduction of conductivity modifying dopant into... – Ion implantation of dopant into semiconductor region

Reexamination Certificate

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C438S527000, C257S506000

Reexamination Certificate

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08058158

ABSTRACT:
A method for manufacturing a hybrid semiconductor substrate comprises the steps of (a) providing a hybrid semiconductor substrate comprising a semiconductor-on-insulator (SeOI) region, that comprises an insulating layer over a base substrate and a SeOI layer over the insulating layer, and a bulk semiconductor region, wherein the SeOI region and the bulk semiconductor region share the same base substrate; (b) providing a mask layer over the SeOI region; and (c) forming a first impurity level by doping the SeOI region and the bulk semiconductor region simultaneously such that the first impurity level in the SeOI region is contained within the mask. Thereby, a higher number of process steps involved in the manufacturing process of hybrid semiconductor substrates may be avoided.

REFERENCES:
patent: 2005/0148144 (2005-07-01), Chou et al.
patent: 2007/0269963 (2007-11-01), Cheng et al.
patent: 2008/0217690 (2008-09-01), Mandelman et al.
patent: 2008/0220595 (2008-09-01), Lin et al.
patent: 2009/0159932 (2009-06-01), Pinto et al.
patent: 2917235 (2008-12-01), None
Yamaoka et al., IEEE Journal of Solid-State Circuits, vol. 41, No. 11, Nov. 2006, pp. 2366-2372.
European Search Report and Opinion for European Application No. 09290372.3 dated Oct. 15, 2009, 5 pages.

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