Hole query for functional coverage analysis

Details Hole query for functional coverage analysis Hole query for functional coverage analysis

2008-09-23

2008-09-23

Do, Thuan (Department: 2825)

Computer-aided design and analysis of circuits and semiconductor

Nanotechnology related integrated circuit design

C716S030000, C716S030000, C716S030000

Reexamination Certificate

active

11260781

ABSTRACT:
Functional coverage techniques during design verification using cross-product coverage models and hole analysis are enhanced by the use of coverage queries. After running a test suite, a core set of non-covered events is specified. A coverage query is then automatically constructed and executed on the test results to identify a hole in the functional coverage that satisfies conditions of the coverage query and includes the core set. The results of the query are presented as a simplified view of the coverage of the events in the cross-product space. Use of coverage queries allows a verification team to focus on specific areas of interest in the coverage space and to deal practically with highly complex coverage models. It also avoids the burden of producing and evaluating complete hole analysis reports.

REFERENCES:
patent: 2007/0011631 (2007-01-01), Fine et al.
Lachish et al.,Hole Analysis for Functional Coverage Data, 39th Design Automation Conference, DAC 2002, New Orleans, Louisiana.
M. Karnaugh,The Map Method for Synthesis of Combinational Logic Circuits, Transactions of the American Institute of Electrical Engineers, 72(9):593-599, Nov. 1953.
J. R. Quinlan,Inductions of Decision Trees, Machine Learning, 1:81-106, 1986.
S. Fine and A. Ziv,Enhancing the Control and Efficiency of the Covering Process, in Proceedings of the High-Level Design Validation and Test Workshop, pp. 96-101, Nov. 2003.
Andrew Piziali, Functional Verification Coverage and Analysis, Kluwer Academic Publishers, 2004, Chapters 4 and 7.
Shai Fine and Avi Ziv, Coverage Directed Test Generation for Functional Verification Using Bayesian Networks, DAC 2003.

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