Highly-planar interlayer dielectric thin films in integrated cir

Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating

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257641, 257637, 257650, 257758, H01L 2358, H01L 2348

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active

055980287

ABSTRACT:
A planarization process for the manufacturing of highly-planar interlayer dielectric thin films in integrated circuits, particularly in non-volatile semiconductor memory devices, comprises the steps of: forming a first barrier layer over a semiconductor substrate wherein integrated devices have been previously obtained; forming a second layer of oxide containing phosphorous and boron over the first undoped oxide the concentration of boron being lower than the concentration of phosphorous; forming a third layer of oxide containing phosphorous and boron over the second oxide layer, the concentration of phosphorous being lower than or equal to the concentration of boron; performing a thermal process at a temperature sufficient to melt the third oxide layer, to obtain a planar surface.

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patent: 5332924 (1994-07-01), Kobayashi
Kern et al., "Chemically Vapor-Deposited Borophosphosilicate Glasses for Silicon Device Applications," RCA Review 43(3):423-457, Sep. 1982.

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