Active solid-state devices (e.g. – transistors – solid-state diode – With means to control surface effects – Insulating coating
Patent
1995-06-06
1997-01-28
Saadat, Mahshid
Active solid-state devices (e.g., transistors, solid-state diode
With means to control surface effects
Insulating coating
257641, 257637, 257650, 257758, H01L 2358, H01L 2348
Patent
active
055980287
ABSTRACT:
A planarization process for the manufacturing of highly-planar interlayer dielectric thin films in integrated circuits, particularly in non-volatile semiconductor memory devices, comprises the steps of: forming a first barrier layer over a semiconductor substrate wherein integrated devices have been previously obtained; forming a second layer of oxide containing phosphorous and boron over the first undoped oxide the concentration of boron being lower than the concentration of phosphorous; forming a third layer of oxide containing phosphorous and boron over the second oxide layer, the concentration of phosphorous being lower than or equal to the concentration of boron; performing a thermal process at a temperature sufficient to melt the third oxide layer, to obtain a planar surface.
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Kern et al., "Chemically Vapor-Deposited Borophosphosilicate Glasses for Silicon Device Applications," RCA Review 43(3):423-457, Sep. 1982.
Bacchetta Maurizio
Losavio Aldo
Arroyo T. M.
Carlson David V.
Saadat Mahshid
SGS--Thomson Microelectronics S.r.l.
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