Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode
Reexamination Certificate
2007-12-18
2007-12-18
Estrada, Michelle (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
Having insulated electrode
C257S335000, C257SE29027
Reexamination Certificate
active
11114693
ABSTRACT:
There is provided a high voltage gate driver integrated circuit. The high voltage gate driver integrated circuit includes: a high voltage region; a junction termination region surrounding the high voltage region; a low voltage region surrounding the junction termination region; a level shift transistor disposed between the high voltage region and the low voltage region, at least some portions of the level shift transistor being overlapped with the junction termination region; and/or a high voltage junction capacitor disposed between the high voltage region and the low voltage region, at least some portions of the high voltage junction capacitor being overlapped with the junction termination region.
REFERENCES:
patent: 5275961 (1994-01-01), Smayling et al.
patent: 5859456 (1999-01-01), Efland et al.
patent: 6242787 (2001-06-01), Nakayama et al.
patent: 2002/0005550 (2002-01-01), Takahashi et al.
Jeon Chang-ki
Kim Sung-lyong
Kwon Tae-hun
Estrada Michelle
Fairchild Korea Semiconductor Ltd
FitzGerald Esq. Thomas R.
Hiscock & Barclay LLP
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