Radiant energy – Inspection of solids or liquids by charged particles – Electron microscope type
Patent
1978-03-01
1980-01-29
Anderson, Bruce C.
Radiant energy
Inspection of solids or liquids by charged particles
Electron microscope type
250443, G01M 2300
Patent
active
041863054
ABSTRACT:
The present invention relates to a high-temperature microscope. According to this invention, a specimen is held in vacuum with one side of it heated through exposure to an electron beam and the other side of it observed through an observation window.
A curtain of inert gas is formed between the specimen and the observation window to prevent the window from being clouded, i.e., to prevent vapor deposit on the window from the specimen.
Visual observation (including photography) and measurement of the specimen temperature by heat radiation therefrom are done individually with different bands of wavelengths. For the purpose of illuminating the specimen, beams of spectral distribution containing the components of in the visible band for observation are used but no components of the temperature-measuring band are utilized as light source. For the purpose of visual observation, a narrow visible band contained in the aforesaid beam located in low brightness in the heat radiation beams from the specimen is utilized.
REFERENCES:
patent: 3514595 (1970-05-01), Schwarz et al.
patent: 4115802 (1978-09-01), Kramer
"Temperature Control of Metallic Target, in Vacuo by Electron Beam and IR Radiometry Tech.", Lewis et al, Review of Scie. Inst., vol 40, No. 5, May 69, pp. 698-702, class 250-443.
Arita Kazutoshi
Hirano Yutaka
Kawamura Hisashki
Maru Kimio
Nakajima Fumio
Anderson Bruce C.
Union Kogaku Kabushiki Kaisha
LandOfFree
High-temperature microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High-temperature microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High-temperature microscope will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-882701