High speed waveform sampling with a tunneling microscope

Details High speed waveform sampling with a tunneling microscope High speed waveform sampling with a tunneling microscope

1989-03-23

1991-05-28

Anderson, Bruce C.

Radiant energy

Inspection of solids or liquids by charged particles

G01N 2300

Patent

active

050197070

ABSTRACT:
Stroboscopic voltage measurements are effected within a short time window with very high spatial resolution using a tunneling microscope. Sampling the tunneling current is implemented by modulating the distance between the tunneling tip and a conductor which carries the waveform to be sampled. In one embodiment, the tunneling tip is mounted on a crystal oscillator to modulate the separation between the tunneling tip and the conductor. As an alternative, an acoustic modulator is used to produce mechanical motion in the surface of the sample in order to modulate the distance between the sample and the tunneling tip.

REFERENCES:
patent: 4343993 (1982-08-01), Binnig
patent: 4665313 (1987-05-01), Wells
patent: 4698502 (1987-10-01), Bednorz
patent: 4724318 (1988-02-01), Binnig
patent: 4851671 (1989-07-01), Pohl
"Simplified Scanning Tunneling Microscope for Surface Topography Measurements", IBM TDB, vol. 28, No. 10, pp. 4356-4357 (Mar. 1986).
Binning, IBM Journal of Research and Development, vol. 30, p. 355 (1986).
Auston, Applied Physics Letters, vol. 26, No. 3, p. 101 (1975).
May et al., Applied Physics Letters, vol. 51, No. 2, p. 145 (1987).
Menzel et al, Scanning, vol. 5, p. 103 (1983).
Hosaka et al., "Observation of pn Junctions on Implanced Silicon Using a Scanning Tunneling Microscope", Applied Physics Letters, vol. 53, No. 6, pp. 487-489 (Aug. 1988).
Muralt et al., "Scanning Tunneling Microscopy and Potentiometry on a Semiconductor Heterojunction", Applied Physics Letters, vol. 50, No. 19, pp. 1352-1354 (May 1987).

Affiliated with

Also associated with

Rating

High speed waveform sampling with a tunneling microscope does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with High speed waveform sampling with a tunneling microscope, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High speed waveform sampling with a tunneling microscope will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-36895