High-speed testing circuit

Electricity: measuring and testing – Plural – automatically sequential tests

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Details

235304, G01R 1512

Patent

active

040925897

ABSTRACT:
High-speed testing circuitry which, when coupled to one terminal of a multi-terminal electronic device, such as an integrated circuit, can either supply test stimuli signals up to a frequency of 30 MHz, receive output signals produced by the device under test in response to test stimuli signals applied by associated test circuits and compare these signals against computer predicted signals, or provide for parametric testing of the device.

REFERENCES:
patent: 3976940 (1976-08-01), Chau et al.

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