Semiconductor device manufacturing: process – Chemical etching – Combined with coating step
Patent
1998-01-28
2000-05-23
Utech, Benjamin L.
Semiconductor device manufacturing: process
Chemical etching
Combined with coating step
706712, 706723, 706724, H01L 2100, H01L 213065
Patent
active
060665661
ABSTRACT:
A collar oxide is formed in a provided a semiconductor substrate having (3) a partially full trench, (2) (i) fill surface defined by fill material partially filling said trench, (ii) upper surface outside of said trench, and (iii) trench sidewall surface not covered by said fill material, and (3) a conformal oxide layer overlying said fill, upper, and sidewall surfaces, by selectively etching as follows:
REFERENCES:
patent: 5118384 (1992-06-01), Harmon et al.
patent: 5314575 (1994-05-01), Yanagida
patent: 5338399 (1994-08-01), Yanagida
patent: 5468339 (1995-11-01), Gupta et al.
patent: 5468340 (1995-11-01), Gupta et al.
patent: 5474953 (1995-12-01), Shimizu et al.
patent: 5521114 (1996-05-01), Rajeevakumar
patent: 5543348 (1996-08-01), Hammerl et al.
patent: 5585280 (1996-12-01), Kwasnick et al.
patent: 5594682 (1997-01-01), Lu et al.
patent: 5656535 (1997-08-01), Ho et al.
patent: 5670805 (1997-09-01), Hammerl et al.
Naeem Munir-ud-Din
Sendelbach Matthew J.
Wang Ting-Hao
Capella Steven
International Business Machines - Corporation
Umez-Eronini Lynette T.
Utech Benjamin L.
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