High reliability integrated circuit memory

Details High reliability integrated circuit memory High reliability integrated circuit memory

1986-01-13

1988-08-02

Moffitt, James W.

Static information storage and retrieval

Read/write circuit

Bad bit

G11C 700

Patent

active

047617675

ABSTRACT:
The invention provides integrated circuit memories with repair circuits. These repair circuits allow redundant memory cell lines to be substituted for defective cell lines. The invention takes advantage of the existence of these substitution circuits for electrically, and no longer only functionally, decoupling the defective lines. A connection connects circuits for biasing the cell lines to the repair circuit of this line. When the line is repaired (i.e. neutralized) it is automatically unbiased.

REFERENCES:
patent: 4358833 (1982-11-01), Folmsbee et al.
patent: 4532611 (1985-07-01), Countryman, Jr.
patent: 4639895 (1987-01-01), Iwahashi et al.
patent: 4707810 (1987-11-01), Ferrant

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