High performance serial bus testing methodology

Details High performance serial bus testing methodology High performance serial bus testing methodology

2003-03-25

2008-12-09

Chung, Phung M (Department: 2117)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Transmission facility testing

C714S738000

Reexamination Certificate

active

07464307

ABSTRACT:
According to one embodiment, a built-in self test (IBIST) architecture/methodology is disclosed. The IBIST provides for testing the functionality of an interconnect (such as a bus) between a transmitter and a receiver component. The IBIST architecture includes a pattern generator and a pattern checker. The pattern checker operates to compare a received plurality of bits (for the pattern generator) with a previously stored plurality of bits.

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PCT Searh Report, PCT/US2004/004219, mailed Nov. 5, 2004.

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