Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device
Reexamination Certificate
2008-01-11
2009-06-16
Lee, Hsien-ming (Department: 2823)
Active solid-state devices (e.g., transistors, solid-state diode
Field effect device
C257S262000, C257S288000, C257SE21411, C438S149000, C438S151000, C438S159000
Reexamination Certificate
active
07547930
ABSTRACT:
Structure and methods of fabrication are disclosed for an enhanced FET devices in which dopant impurities are prevented from diffusing through the gate insulator. The structure comprises a Si:C, or SiGe:C, layer which is sandwiched between the gate insulator and a layer which is doped with impurities in order to provide a preselected work function. It is further disclosed how this, and further improvements for FET devices, such as raised source/drain and multifaceted gate on insulator, MODFET on insulator are integrated with strained Si based layer on insulator technology.
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International Business Machines - Corporation
Lee Hsien-ming
Sai-Halasz George
Trepp Robert M.
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