Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching
Reexamination Certificate
2003-04-14
2008-08-19
Ahmed, Shamim (Department: 1792)
Semiconductor device manufacturing: process
Chemical etching
Liquid phase etching
C438S689000, C438S369000, C438S694000, C438S766000
Reexamination Certificate
active
07413996
ABSTRACT:
A method of forming a high k gate insulation layer in an integrated circuit on a substrate. A high k layer is deposited onto the substrate, and patterned with a mask to define the high k gate insulation layer and exposed portions of the high k layer. The exposed portions of the high k layer are subjected to an ion implanted species that causes lattice damage to the exposed portions of the high k layer. The lattice damaged exposed portions of the high k layer are etched to leave the high k gate insulation layer.
REFERENCES:
patent: 6063698 (2000-05-01), Tseng et al.
patent: 6303418 (2001-10-01), Cha et al.
patent: 6455330 (2002-09-01), Yao et al.
patent: 6455382 (2002-09-01), Lin et al.
patent: 6538271 (2003-03-01), Saida et al.
patent: 6656852 (2003-12-01), Rotondaro et al.
patent: 6764898 (2004-07-01), En et al.
patent: 6818516 (2004-11-01), Lo et al.
patent: 6818553 (2004-11-01), Yu et al.
patent: 6855639 (2005-02-01), Brask et al.
patent: 2002/0168826 (2002-11-01), Jin et al.
patent: 2003/0230549 (2003-12-01), Buchanan et al.
patent: 2004/0129674 (2004-07-01), Bease et al.
patent: 2005/0048791 (2005-03-01), Brask et al.
patent: 2005/0115925 (2005-06-01), Paraschiv et al.
patent: 59121965 (1984-07-01), None
Shirato, Semiconductor Device, Jul. 14, 1984, Englisn Abstract of JP 59121965 A, 2 pages.
Gopinath Venkatesh
Kamath Arvind
Lo Wai
Ahmed Shamim
LSI Corporation
Luedeka Neely & Graham
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