High k gate insulator removal

Semiconductor device manufacturing: process – Chemical etching – Liquid phase etching

Reexamination Certificate

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Details

C438S689000, C438S369000, C438S694000, C438S766000

Reexamination Certificate

active

07413996

ABSTRACT:
A method of forming a high k gate insulation layer in an integrated circuit on a substrate. A high k layer is deposited onto the substrate, and patterned with a mask to define the high k gate insulation layer and exposed portions of the high k layer. The exposed portions of the high k layer are subjected to an ion implanted species that causes lattice damage to the exposed portions of the high k layer. The lattice damaged exposed portions of the high k layer are etched to leave the high k gate insulation layer.

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Shirato, Semiconductor Device, Jul. 14, 1984, Englisn Abstract of JP 59121965 A, 2 pages.

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