Optical: systems and elements – Having significant infrared or ultraviolet property – Multilayer filter or multilayer reflector
Patent
1989-10-30
1991-08-27
Arnold, Bruce Y.
Optical: systems and elements
Having significant infrared or ultraviolet property
Multilayer filter or multilayer reflector
427255, 359884, 359838, G02B 508, C23C 1600
Patent
active
050428870
ABSTRACT:
Optical reflectors and methods of constructing optical reflectors having high damage thresholds, durability and general applicability are disclosed in which a highly planar substrate, such as a single crystal silicon or other single crystalline material, is disposed within a deposition chamber and oriented to present a particular crystallographic plane. An epitaxial layer of reflective metal, such as aluminum, is grown upon the substrate by ion beam or other method of deposition and then covered with a transparent protective coating.
REFERENCES:
patent: 4482209 (1984-11-01), Grewal et al.
patent: 4799454 (1989-01-01), Ito
patent: 4805555 (1989-02-01), Itoh
Hutcheson, E. T., Hass, G. and Cox, J. T., Effect of Deposition Rate and Substrate Temperature on the Vacuum Ultraviolet Reflectance of MgF.sub.2 -- and LiF--Overcoated Aluminum Mirrors, Applied Optics, vol. 11, No. 10, Oct. 1972, pp. 2245-2248.
Yamada et al., Epitaxial Growth of Al on Si(111) and Si(100) by Ionized-Cluster Beam, J. Appl. Phys. 56 (10), Nov. 15, 1984, pp. 2746-2750.
Yamada et al., Ionized Cluster Beam Epitaxy of Single Crystalline Aluminum Films on Semiconductors and Insulators as an Approach to New Device Structures, Extended Abstract of the 17th Conf. on Solid State Devices and Materials, Tokyo, 1985, pp. 313-316.
Takagi, History and Current Status of the Ionized Cluster Beam Technique, Proc. Int'l Workshop on ICBT Tokyo-Kyoto (1986).
Yamada et al., Current Status of Ionized-Cluster Beam Technique: A Low Energy Ion Beam Deposition, Nuclear Instruments and Methods in Physics Research (1987), pp. 120-123.
Arnold Bruce Y.
Engellenner Thomas J.
Epion Corporation
Parsons David R.
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