Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making named article
Patent
1987-09-21
1990-01-23
Dees, Jose G.
Radiation imagery chemistry: process, composition, or product th
Imaging affecting physical property of radiation sensitive...
Making named article
430320, 430323, 430394, 156643, 156654, 1566591, 3501622, 35016221, 35016224, 350409, 350417, G03C 500, B29D 1100
Patent
active
048957909
ABSTRACT:
The method utilizes high resolution lithography, mask aligning, and reactive ion etching. In particular, at least two binary amplitude masks are generated. A photoresist layer on an optical element substrate is exposed through the first mask and then etched. The process is then repeated for the second and subsequent masks to create a multistep configuration. The resulting optical element is highly efficient.
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Swanson Gary J.
Veldkamp Wilfrid B.
Dees Jos,e G.
Loney Donald J.
Massachusetts Institute of Technology
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