High density trenched DMOS transistor

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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Details

257329, 257330, 257341, H01L 2976, H01L 2994, H01L 31062, H01L 31113

Patent

active

056891288

ABSTRACT:
The cell density of a trenched DMOS transistor is increased by overcoming the problem of lateral diffusion of deep P+body regions. This problem is solved in three versions. In a first version, the deep P+body region is formed using a high energy implant into a single epitaxial layer. In a second version, a double epitaxial layer is used with a somewhat lower but still high energy deep P+body implant. In a third version, there is no deep P+body implant but only the double epitaxial layer is used. The cell density is improved to more than 12 million cells per square inch in each of the three versions.

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