Coating apparatus – Gas or vapor deposition – With treating means
Patent
1992-10-19
1995-06-06
Breneman, R. Bruce
Coating apparatus
Gas or vapor deposition
With treating means
118723AN, 156345, 20429837, C23C 1650
Patent
active
054218918
ABSTRACT:
Plasma deposition or etching apparatus is provided which comprises a plasma source located above and in axial relationship to a substrate process chamber. Surrounding the plasma source are an inner magnetic coil and an outer magnetic coil arranged in the same plane perpendicular to the axis of the plasma source and the substrate process chamber. Preferably, a first current is provided through the inner coil and a second current in a direction opposite to the direction of the first current is provided through the outer coil. The result is to advantageously shape the magnetic field in the process chamber to achieve extremely uniform processing, particularly when a unique diamond shaped pattern of gas feed lines is used wherein the diamond is arranged to be approximately tangent at four places to the outer circumference of the workpiece being processed in the apparatus.
REFERENCES:
patent: 4101411 (1978-07-01), Suzuki et al.
patent: 4368092 (1983-01-01), Steinberg
patent: 4401054 (1983-08-01), Matsuo et al.
patent: 4421898 (1983-12-01), Lundberg
patent: 4433228 (1984-02-01), Nishimatsu
patent: 4557819 (1985-12-01), Meacham et al.
patent: 4610748 (1986-09-01), Engle et al.
patent: 4626312 (1986-12-01), Tracy
patent: 4668338 (1987-05-01), Maydan et al.
patent: 4668365 (1987-05-01), Foster et al.
patent: 4810935 (1989-05-01), Boswell
patent: 4844775 (1989-07-01), Keeble
patent: 4859908 (1989-08-01), Yoshida et al.
patent: 4876983 (1989-10-01), Fukuda et al.
patent: 4918031 (1990-04-01), Flamm et al.
patent: 4948458 (1990-08-01), Ogle
patent: 4948750 (1990-08-01), Kausche et al.
patent: 4963242 (1990-10-01), Sato et al.
patent: 4990229 (1991-02-01), Campbell et al.
patent: 5032202 (1991-07-01), Tsai et al.
patent: 5089441 (1992-02-01), Moslehi
patent: 5091049 (1992-02-01), Campbell et al.
patent: 5122251 (1992-06-01), Campbell et al.
Keizo Suzuki et al., "Microwave plasma etching," Vacuum, vol. 34, No. 10/11 (1984), pp. 953-957.
Boswell, "Plasma Production Using A Standing Helicon Wave," Physics Letters, vol. 33A (1970), pp. 457-458.
Montgomery et al., "Effects of Uniform Rotation on Helically-deformed, Resistive, Magnetohydrodynamic Equilibria," Plasma Physics and Controlled Fusion, vol. 33, No. 14 (1991), pp. 1871-1875.
Limpaecher et al., "Magnetic Multipole Containment of Large Uniform Collisionless Quiescent Plasmas," Rev. Sci. Instrum., vol. 44, No. 6 (1973), pp. 726-731.
Campbell Gregor A.
Conn Robert W.
Katz Dan
Parker N. William
Pearson David I. C.
Baskin Jonathan D.
Breneman R. Bruce
MacPherson Alan H.
Millers David T.
Plasma & Materials Technologies, Inc.
LandOfFree
High density plasma deposition and etching apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with High density plasma deposition and etching apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and High density plasma deposition and etching apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-984104