High density logic analyzer probing system

Details High density logic analyzer probing system High density logic analyzer probing system

2005-05-03

2005-05-03

Zarneke, David (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S754090

Reexamination Certificate

active

06888361

ABSTRACT:
A high density logic analyzer probing system has a probe mounting fixture for accurately positioning mounting posts to a device under test (DUT). The mounting posts includes a recess in one side for receiving a spring wire clip that mounts through holes in the DUT. The housing includes protrusions that receive screws for securing the probe head to the mounting posts on the DUT. The screws have a first shoulder that engages the protrusions and a second shoulder that engages the mounting post. The probe head is positioned between the mounting posts and tightened to the DUT using the screws. The first shoulder applies downward pressure on the probe head and the second shoulder provides a positive stop to prevent over tightening of the probe head which can cause damage to probe contacts in the probe head.

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patent: 6447339 (2002-09-01), Reed et al.
patent: 6781391 (2004-08-01), Reed et al.
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“Agilent Technologies Soft Touch Connectorless Probes”—User's Guide, Agilent Technologies, Inc. 2002-2004, 78 Pages.
“Tektronix TMS817 and TMS818 PCIExpress Buss Supports 071-1214-00”—Instruction Manual, Copyright Tektronix, Inc., 65 Pages.

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