High-density DRAM structure on soi

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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Details

257300, 257301, H01L 27108, H01L 2976, H01L 2994, H01L 31119

Patent

active

055280625

ABSTRACT:
A high density, DRAM cell array with a very short channel, vertical gate transfer transistor that can be manufactured using conventional photolithography process steps. The conventional four-by-four DRAM array shown schematically in FIG. 1a is rearranged to the shared-gate, double-bit array shown schematically in FIG. 1b. Trench storage capacitors and vertical FET transistors are arranged in pairs with a common vertical gate and a common substrate, allowing both bit and substrate contacts to be shared by adjacent cells.

REFERENCES:
patent: 4673962 (1987-06-01), Chatterjee et al.
patent: 4688063 (1987-08-01), Lu et al.
patent: 4689871 (1987-09-01), Malhi
patent: 4797373 (1989-01-01), Malhi et al.
patent: 4801988 (1989-01-01), Kenney
patent: 4898837 (1990-02-01), Takeda et al.
patent: 4969022 (1990-11-01), Nishimoto et al.
patent: 4985368 (1991-01-01), Ishii et al.
patent: 5021852 (1991-06-01), Sukegawa et al.
"A New Five-Watt, Class A, Silicon Power Transistor"; P. Flaherty et al.; 1958 Ire National Convention Record; Part 3--Electron Devices; pp. 77-83, Aug. 28, 1958.
IBM Technical Disclosure Bulletin; vol. 17, No. 9, Feb./1975; "Capacitor for Single FET Memory Cell"; G. V. Clarke et al.; pp. 2579-2580.
IBM Technical Disclosure Bulletin; vol. 28, No. 8, Jan./1986; "Capactive Loan FET Static RAM in Trench Technology"; pp. 3385-3386.
IBM Technical Disclosure Bulletin; vol. 28, No. 10, Mar./1986; "Static RAM Cell Structure"; pp. 4320-4322.
IBM Technical Disclosure Bulletin; vol. 29, No. 3; Aug./1986; "Trench Transistor with Independent Gate Control"; p. 1028.
IBM Technical Disclosure; vol. 29, No. 5, Oct./1986; "High Density Vertical DRAM Cell"; pp. 2335-2340.
IBM Technical Disclosure; vol. 30, No. 5, Oct./1987; "Flanged Trench Capacitor Cell"; pp. 410-411.
IBM Technical Disclosure; vol. 30, No. 8, Jan./1988; "Process to Make Self-Aligned Dynamic Random-Access Memory Cells"; pp. 327-328.
IBM Technical Disclosure; vol. 31, No. 7, Dec./1988; "Isolation Merged Stacked Dynamic Random-Access Memory Cell"; pp. 39-40.

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