High DC breakdown voltage field effect transistor and integrated

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Having insulated electrode

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361 56, 361 91, 257355, 257357, 257409, H01L 2702

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active

051628880

ABSTRACT:
A field effect transistor device formed on an integrated circuit chip substrate and driven by the on-chip voltages having a well region formed in the substrate, and source and drain regions one of which is formed in the well region. The well region has a lower doping concentration than the source and drain regions and is of the same conductivity type. The well region provides a reduced electric field gradient at the source/substrate or drain/substrate junction and significantly increases the breakdown resistance of the device to DC voltages higher than the on-chip voltages. An input/output protection circuit employing the field effect transistor coupled in series between an integrated circuit output pad and the active devices on the chip providing ability to withstand coupling of the pad to a relatively high DC voltages.

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D. E. Nelsen et al., "Design and Test Results for a Robust CMOS VLSI Input Protection Network", EOS/ESD Symposium Proc., 1986.

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