High contrast, positive photoresist developer containing alkanol

Radiation imagery chemistry: process – composition – or product th – Imaging affecting physical property of radiation sensitive... – Making printing plates

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430325, 430331, 252156, 252541, 252544, 252547, G03C 524, G03C 534

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051262304

ABSTRACT:
Compositions and methods for developing quinone diazide positive-working photoresists. The compositions consist essentially of an aqueous solution of a tetraalkylammonium hydroxide and an adjunct having a structure selected from: ##STR1## wherein n is 0 or 1; m is 1 or 2; and each R.sup.1 and R.sup.2 is independently selected from hydrogen, methyl, or ethyl, but in Structure I the two R.sup.2 's are not both ethyl. The methods involve use of this composition to develop the indicated photoresists. The addition of an adjunct of the indicated type prevents the formation of irregular deposits on the edges of unexposed portions of the photoresist lines when the photoresist is developed. Selection of these adjuncts also increases the uniformity of line widths of photoresist lines developed according to the present invention, and increases the process latitude of the developer.

REFERENCES:
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patent: 4294911 (1981-10-01), Guild
patent: 4379830 (1983-04-01), Deutsch et al.
patent: 4411981 (1983-10-01), Minezaki
patent: 4464461 (1984-08-01), Guild
patent: 4530895 (1985-07-01), Simon et al.
patent: 4729941 (1988-03-01), Itoh et al.
patent: 4808513 (1989-02-01), Lazarus et al.
Grigorovich et al., "Interaction of Photosensitive Materials, etc." translated from Zhurnal Prikladnoi Khimii, vol. 48, No. 6 pp. 1307-1311, Jun. 1975.
Patent Abstracts of Japan, vol. 6, No. 209 (P-150) (1087), Oct. 21st 1982: JP-A-57 114 141 (Sanei Kagaku Kogyo K.K.) Jun. 15, 1982.
European Search Report #EP 88 30 2542 of Dec. 20, 1988.

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