Semiconductor device manufacturing: process – Making passive device – Stacked capacitor
Patent
1996-01-25
1997-04-22
Nguyen, Tuan H.
Semiconductor device manufacturing: process
Making passive device
Stacked capacitor
438398, 438738, H01L 2170
Patent
active
056228899
ABSTRACT:
A method for manufacturing a high capacitance capacitor having an HSG film formed on a stack-structured lower storage node, includes the step of forming insulating films for protecting the HSG film. In the present invention the lower storage node and the HSG film formed thereon are not damaged during an etch-back process. The HSG film formed on the lower storage node is protected by means of the insulating films, thereby preventing a decrease in capacitor capacitance.
REFERENCES:
patent: 5366917 (1994-11-01), Watanabe et al.
patent: 5447878 (1995-09-01), Park et al.
patent: 5486488 (1996-01-01), Kamiyama
Sakao, M., "A Capacitor-Over-Bit-Line (COB) Cell With A Hemispherical-Grain Storage Node for 64Mb DRAMs", IEDM 90-655, IEEE 1990, pp. 27.3.1-27.3.4.
Kim Young-sun
Park Young-wook
Shim Se-jin
Yoo Cha-young
Nguyen Tuan H.
Samsung Electronics Co,. Ltd.
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