Static information storage and retrieval – Systems using particular element – Magnetoresistive
Reexamination Certificate
2007-02-16
2008-12-09
Ho, Hoai V (Department: 2827)
Static information storage and retrieval
Systems using particular element
Magnetoresistive
C365S131000, C365S173000
Reexamination Certificate
active
07463510
ABSTRACT:
A magnetoresistive random access memory (MRAM) device includes a memory cell corresponding to one read bit line, one read word line, one write word line, and two or more write bit lines. The memory cell includes a first memory unit and a second memory unit each corresponding to a respective write bit line. Each of the first and second memory units comprises: a free magnetic region having a first easy axis, a pinned magnetic region having a second easy axis, and a tunneling barrier between the free magnetic region and the pinned magnetic region.
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Chien-Chung Hung et al., A 6-F2Bit Cell Design Based on One Transistor and Two Uneven Magnetic Tunnel Junctions Structure and Low Power Design for MRAM.
Hung Chien-Chung
Kao Ming-Jer
Lee Yuan-Jen
Finnegan Henderson Farabow Garrett & Dunner LLP
Ho Hoai V
Industrial Technology Research Institute
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